Multiparameter Substrate Tester (IZM-36) - PR911796-2590-P

3 multiparameter substrate testers in a self-contained, self-functioning system:

The qualification of substrates and assemblies containing substrates and active components is essential in order to be able to make qualified statements about service life and reliability. The parameters for the qualification of such assemblies include climatic stimuli such as temperature and humidity as well as electrical stimuli such as high voltages of up to 3 kV and the precise recording of the resulting low leakage currents in the uA range. In particular, the qualification of power electronic assemblies that use novel wide-bandgap semiconductors such as SiC and GaN also requires dynamically changing stimuli such as fast voltage transients with high voltages and short rise times in order to simulate switching frequencies of up to 500 kHz. Close spatial and functional integration of different stimulator types, e.g. climatic chamber and electrical measurement devices, is necessary to limit interference and the parasitic effects of long leads. These suitability tests require a measurement system that fulfils the test conditions of a static H3TRB, a dynamic H3TRB and a dynamic HTGB.

Optional feature: - External switching (DUT passive) (L.V.-Pos. 2.11)