Magnetfeldprober/ Magnet field Prober - PR866327 3340 -W

The Fraunhofer Institute for Electronic Nano Systems (Fh ENAS), as a contracting authority, is obligated to tender in accordance with public procurement law. In preparation for a tendering procedure to procure an automatic wafer prober with an integrated automatic magnetic test head for magnetic devices and sensors wafer level characterization and testing, we request market participants to review the enclosed requirements for technical implementation free of charge. This specification outlines the requirements necessary for procuring a device that characterizes the electrical properties of magnetoresistive test structures under the influence of magnetic fields. The equipment must comply with all requirements of this specification and the applicable documents. Any changes or additions to the equipment specification made after purchase must be mutually agreed upon by the vendor and Fh ENAS.